Download PDF by G. W. A. Dummer, J. Mackenzie Robertson: American microelectronics data annual. 1964-65

By G. W. A. Dummer, J. Mackenzie Robertson

ISBN-10: 0080110649

ISBN-13: 9780080110646

American Microelectronics facts Annual 1964-65 presents entire details on diversified microelectronics on hand within the U.S.

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Test Conditions: run in accordance with MIL-R-l lC Resistor Spacing - 1/4" Resistor Size - 3/16" x 5/64" Substrate - Ceramic plate 1-1/4" x 1 3/16" witl1 one resistor per plate. All plates Durez coated and wax impregnated. F igures in tables are average of 10 units. All units conditioned 96 hours at 50 ° C. and desiccated before test. Max. applied voltage - 250 Test Values - 100 ohms, 2200 ohms, SOK ohms, 250K ohms, IM ohms, lOM ohms AGING CHARACTE RISTICS Percent Res i stance Range After 500 to 20K ohms 25K to 1 0 Megohms I I I 1 Year After 2 Years - 1 .

C. L. R u t h roff, "Some Broad-Band Transfo r m e r s , ' ' 47 Fig. 22. Sense Amplifier ( Differential ) . The amplifier operates satisfactorily only when the logic circuits in the information ( bit ) driver insure that all " 1 "s readout signals have the same polarity as discussed earlier. The over-all amplifier gain is 3000. The sense amplifier shown in Figure 22 is of a differential type which yields bipolar outputs. The gain of the amplifier is 300, which makes it useful with the BIP- 1 000, 1 60 bit plane.

0 7. 0 s. o 1. 0 6 5 1. 0 s. 0 s. o 1. 0 1 5 1. 0 5. 0 5 5 1. 0 1. 0 5 CONNECTION CONNECTION 5 Vdc 6 2 ~ TYPE I - AMPLIFIER WAFER MAXIMUM RATINGS Connection No. ~ Manufacture r . Bendix Semiconductor Divi sion, Holmdel, New Jers ey. 38 BUNKER-RAMO THIN-FILM HYBRID MICROCIRCUITS Precision, low - c o st thin-film hybrid mic ro - c i rcuits now are available The Bunke r-Ramo Corporation as a re sult of recent technological advanc e s incorporated into the Company ' s mi c roelectronic production fac ility.

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American microelectronics data annual. 1964-65 by G. W. A. Dummer, J. Mackenzie Robertson

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